维纳滤波去除X射线小角散射实验中的模糊效应

Using the Wiena Filter Method to Deal with the Smear Effect in Small Angle X-ray Scattering

在X射线小角散射实验中,光束的分布和探测器的点扩展函数会导致实验数据偏离点光源的理想曲线,造成模糊效应。为了对抗这一效应,本文提出利用维纳滤波的方式对数据进行反卷积处理,从而恢复点光源的理想散射数据。该方法具有可重复性及较强的抗噪声能力,对一维散射数据、二维散射数据以及实验数据都有很好的去模糊效果。经过滤波后的二维散射数据可以做到在探测器上全环积分。

In Small angle X-ray scattering experiments,finite dimensions of incident beam and the point spread function of detector can lead to deviation of experimental data from the ideal scattering data,thus cause a smear effect.To combat this effect,Weina filter method was proposed.The Weina filter employs a deconvolution method to recover the ideal point light source scattering or diffraction data.This method is repeatable and can bear very high noise of experimental data.It has very good effect on dealing with one-dimensional,two-dimensional and experimental data.The filtered two-dimensional data can achieve full-loop integration on the detector.