EDXRD安检系统衍射谱数据库的仿真研究

Simulation study of diffracted spectrum database for EDXRD security inspection system

能量色散X射线衍射(EDXRD)系统在安检领域具有重要的应用前景。基于能量色散X射线衍射原理,以ICDD-JCPDS数据作为初始能谱信息,分析了X射线光源、系统结构、探测器分辨率及物质衰减效应对衍射能谱的影响,建立了与系统特性相对应的衍射谱仿真模型。利用该模型,仿真了不同结构参数EDXRD系统的衍射谱,仿真谱和实际测量结果吻合。在此基础上,仿真了海洛因和NH_4NO_3在不同晶体结构下的衍射能谱,为EDXRD安检系统的识别数据库提供了一种有效的构建方法。

Energy dispersive X-ray diffraction(EDXRD)is a promising technology in the field of security inspection.Using the ICDD-JCPDS data as the initial spectrum information,the influence of X-ray source,system structure,resolution of the detector and material attenuation on the diffraction spectrum were analyzed,and the simulation model corresponding to system characteristics was established based on the theory of the EDXRD.Based on this model,the diffraction spectrums of different system structures were simulated.The results reveal the consistence as indicated by the diffraction experiments.Based on the simulation model,the diffraction energy spectrum of typical prohibited materials such as heroin and NH4NO3 with different crystal structures were calculated,which provides an effective method to construct the recognition database in EDXRD security inspection system.