微波单片集成电路测试技术研究

Testing technology of Monolithic Microwave Integrated Circuits(MMIC)

微波单片集成电路主要应用于无线通讯、雷达、电子对抗等领域,近年随着装备发展对微波器件需求越来越大,其可靠性保证要求也越来越高,而目前单片有源微波器件在国内还处于起步阶段,相关的检测试验技术方法欠缺。针对这一问题,本文开展有源微波器件测试技术研究,以微波放大器、射频开关等几类典型器件为例介绍回波损耗、1dB压缩点、单边带相位噪声等主要微波特性参数的测试方法。

Monolithic microwave integrated circuits are mainly used in wireless communications, radar, electronic warfare and other fields. In recently, with the development of equipment, microwave circuits are widely used, and its reliability must be high. At present, the MMIC is still in its infancy in China, and the related test methods, such as microwave amplifier, RF switch and VCO. The mainly introduces the main microwave characteristic parameters’ testing methods, such as return loss, 1dB compression point and unilateral phase noise.