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0.13μm标准CMOS工艺的高可靠流水线模数转换器

Highly reliable pipeline analog-to-digital converter in 0. 13 μm standard CMOS process
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摘要 针对航空航天电子系统对高性能模数转换器的需求,采用0. 13μm标准互补金属氧化物半导体工艺,设计可以在极端温度和空间辐射环境中稳定可靠工作的12位分辨率、50 MS/s采样率的流水线模数转换器。通过采用无采样保持电路以及抗辐射电路和版图加固等技术,在减小功耗的同时有效地削弱总剂量辐射效应的影响。测试结果表明:在-55~125℃温度范围内以及150 krad(Si)的总剂量辐照条件下,得到大于64 dB的信噪比、大于73. 5 dB的无杂散动态范围和最大0. 22 dB的微分非线性。 For demanding of high performance analog-to-digital converter for aerospace electronic systems,a 12 bit pipelined analog-to-digital converter with speed of 50 MS/s which can work well in harsh temperature and radiation environment,was presented and implemented with 0. 13 μm standard complementary metal Oxide semiconductor process. By employing the circuit without sample-and-hold amplifier,the radiation hardened circuit,and the layout technology,the impact of total ionizing dose effect was significantly alleviated while reducing the power consumption. Test results show that the design achieves a 64 dB signal-to-noise ratio,a 73. 5 dB spurious-free dynamic range,maximum 0. 22 dB differential nonlinearity within wide temperature range of-55 ~ 125 ℃ and survive a total dose of 150 krad(Si).
作者 周宗坤 黄水根 董业民 林敏 ZHOU Zongkun;HUANG Shuigen;DONG Yemin;LIN Min(Shanghai Institute of Microsystem and Information Technology,Chinese Academy of Sciences,Shanghai 200050,China;University of Chinese Academy of Sciences,Beijing 100049,China)
出处 《国防科技大学学报》 EI CAS CSCD 北大核心 2018年第6期165-170,共6页 Journal of National University of Defense Technology
基金 中科院重点部署基金资助项目(KGFZD-135-16-015)
关键词 流水线模数转换器 无采样保持电路 总剂量辐射效应 版图加固技术 pipeline analog-to-digital converter circuit without sample-and-hold amplifier total ionizing dose effect layout reinforcement technology
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