Electromagnetic emanation exploration in FPGA-based digital design

基于FPGA数字设计的电磁辐射探索（英文）

As semiconductor technologies have been shrinking,the speed of circuits,integration density,and the number of I/O interfaces have been significantly increasing.As a consequence,electromagnetic emanation(EME)becomes a critical issue in digital system designs.Electronic devices must meet electromagnetic compatibility(EMC)requirements to ensure that they operate properly,and safely without interference.I/O buffers consume high currents when they operate.The bonding wires,and lead frames are long enough to play as efficient antennas to radiate electromagnetic interference(EMI).Therefore,I/O switching activities significantly contribute to the EMI.In this paper,we evaluate and analyze the impact of I/O switching activities on the EME.We will change the circuit configurations such as the supply voltage for I/O banks,their switching frequency,driving current,and slew rate.Additionally,a trade-off between the switching frequencies and the number of simultaneous switching outputs(SSOs)is also considered in terms of EME.Moreover,we evaluate the electromagnetic emissions that are associated with the different I/O switching patterns.The results show that the electromagnetic emissions associated I/O switching activities depend strongly on their operating parameters and configurations.All the circuit implementations and measurements are carried out on a Xilinx Spartan-3 FPGA.

随着半导体技术的不断萎缩,电路的速度、集成密度和I/O接口的数量显著增加,因此,电磁辐射(EME)成为数字系统设计中的一个关键问题。电子设备必须满足电磁兼容性(EMC)的要求,以确保其正常运行,且不受干扰。I/O缓冲器在工作时消耗大电流。连接线和引线框足够长,可以作为有效的天线发射电磁干扰(EMI)。因此,I/O交换活动对电磁干扰有显著影响。本文对I/O交换活动对电磁环境的影响进行了评价和分析。改变电路配置,如I/O组的供电电压、他们的开关频率、驱动电流和转换率。此外,还考虑了交换频率与同时交换输出(SSOs)数量之间的权衡问题。此外,还评估了与不同I/O开关模式相关的电磁辐射。结果表明,与I/O开关活动相关的电磁辐射强烈依赖于他们的工作参数和配置。所有电路实现和测量都是在Xilinx Spartan-3 FPGA上进行的。