期刊文献+

公差设计对高集成度微波收发组件可靠性的影响 被引量:3

The Influence of Tolerance Design on the Reliability of High Integrated Microwave Transceiver Assembly
下载PDF
导出
摘要 微波收发组件作为有源相控阵天线的核心部件,其主要功能包括微波信号的接收、发射和幅度与相位控制。随着武器装备向小型化、高集成度化和高可靠方向发展,在保持微波收发组件的性能不变的情况下需进一步地提高其集成度。在高集成度微波收发组件的实现过程中发生了部分失效现象,暴露了一些可靠性问题,制约了武器装备的发展。通过分析高集成度微波收发组件的典型失效案例,论述了公差设计对于产品可靠性的重要影响。根据各种失效原因,提出了相应的控制措施,为提高组件的可靠性提供了一定的指导。 Microwave transceiver assembly is the core component of active phased array antenna,and its main functions include receiving and transmitting microwave signal and controlling amplitude and phase.With the development of weapon equipment towards miniaturization,high integration and high reliability,it is necessary to further improve the integration of microwave transceiver assembly while keeping their performance unchanged.In the process of the realization of high integration microwave transceiver assembly,some failure phenomena occurred,which exposed some reliability problems and restricted the development of weapon equipment.By analyzing the typical failure cases of high integrated microware transceiver assembly,the important influence of tolerance design on product reliability is discussed.According to the failure reasons,the corresponding control measures are put forward,which provides some guidance for improving the reliability of assembly.
作者 魏守明 顾江川 张文超 吴小虎 WEI Shouming;GU Jiangchuan;ZHANG Wenchao;WU Xiaohu(Nanjing Electronic Device Institute,Nanjing 210016,China)
出处 《电子产品可靠性与环境试验》 2018年第6期36-40,共5页 Electronic Product Reliability and Environmental Testing
关键词 高集成度微波收发组件 可靠性 公差设计 失效原因 控制措施 high integrated microware transceiver assembly reliability tolerance design failure reason control measure
  • 相关文献

参考文献4

二级参考文献19

共引文献33

同被引文献18

引证文献3

二级引证文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部