半自动纳米量子点检测仪设计

Design of Semiautomatic Testing Equipment for Nano-quantum Dots

为填补纳米量子点研究领域中自动检测试验样本这一空白,结合现有量子点特征,自主设计出了一套专门检测纳米量子点的半自动化设备仪器。经过对几代产品结构的不断改进,并对检测仪器必须设备光谱仪等二次开发,驱动板卡PCI-6722、图像传感器CCD、光谱仪和MEMS微镜等硬件功能与PC软件高度集成,形成了一套成熟的检测系统。并且,在实际检测期间,针对PC上位机和下位机遇到的精确度问题,设计了专门算法以使该检测仪器能够更加直观、高效、准确地为科研人员提供便利。

In order to supplement the blank of the research for testing nano-quantum dots automatically,a special semiautomatic equipment for detecting nano-quantum dots independently based on the feature of quantum dots were designed.After the continuous improvement of the structure of several generations of products,and the secondary development of the testing instrument,such as spectrometer,etc.,the NI company s driving board card pci-6722,image sensor CCD,spectrometer and MEMS micromirror and other hardware functions were highly integrated with PC software,forming a mature testing system.In addition,during the actual detection,a special algorithm was designed for the accuracy problem of PC upper computer and lower computer to make the detection instrument more intuitive,efficient and accurate to provide convenience for researchers.