摘要
The spatial resolved method, which measures the laser-induced damage fluence by identifying the location of the damage point in the Gaussian beam three-dimensional direction, is demonstrated. The advantages and practicality of this method have been explained. Taking a triple frequency beam splitter as an example, the defect damage fluence can be accurately calculated by the spatial resolved method. The different defect damage performance of the triple frequency splitter is distinguished under irradiations of only the 355 and 532 nm lasers. The spatial resolved method provides a way to obtain precise information of optical film defect information.
The spatial resolved method, which measures the laser-induced damage fluence by identifying the location of the damage point in the Gaussian beam three-dimensional direction, is demonstrated. The advantages and practicality of this method have been explained. Taking a triple frequency beam splitter as an example, the defect damage fluence can be accurately calculated by the spatial resolved method. The different defect damage performance of the triple frequency splitter is distinguished under irradiations of only the 355 and 532 nm lasers. The spatial resolved method provides a way to obtain precise information of optical film defect information.
作者
Chong Shan
Yuanan Zhao
Yanqi Gao
Xiaohui Zhao
Guohang Hu
Weixin Ma
Jianda Shao
单翀;赵元安;高妍琦;赵晓晖;胡国行;马伟新;邵建达(Shanghai Institute of Laser Plasma, China Academy of Engineering Physics;Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics,Chinese Academy of Sciences;State Key Laboratory of Applied Optics, Changchun Institute of Optics, Fine Mechanics and Physics,Chinese Academy of Sciences;IFSA Collaborative Innovation Center, Shanghai Jiao Tong University)
基金
supported by the National Natural Science Foundation of China(No.4317)
the National Key Research and Development Project of China(No.2016YFE0104300)
