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一种SRAM型FPGA单粒子效应加固平台设计 被引量:3

A platform design of single event effect mitigation for SRAM-based FPGA
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摘要 针对大规模集成电路在空间环境的应用需求,介绍了目前国内外针对FPGA的抗辐射加固的研究现状,对空间辐射和单粒子效应进行了简单描述,分析了SRAM型FPGA的结构和故障特点,提出了一种基于高可靠单元针对Xilinx Kintex-7系列FPGA进行配置、监控、回读校验和刷新的单粒子翻转加固硬件平台设计。介绍了对Kintex-7系列FPGA进行防护的流程和故障注入测试系统的组成,该平台已经在某项目中得到应用并通过了功能测试和相关环境试验,为大规模集成电路在空间应用提供了设计参考。 Be aimed at application requirements of VLSI(very large scale integration) in space environment, current researching status in China and abroad of radiation harden of FPGA are introduced in the paper. With a simple description of space radiation environment and SEE( single event effect) and analyzing the structure and fault characteristics of SRAM-based FPGA, a hardware platform design of single event effect mitigation for configuration, monitoring, readback verification and Scrubbing of Xilinx Kintex-7 series FPGA based on HRU(high reliability unit) is proposed. The process of protecting Kintex-7 series FPGA and the composition of SEU injection test system are elaborated. The platform is used in a project and has passed functional testing and related environmental tests, and it has provided a design reference for space application of VLSI.
作者 齐刘宇 刘国栋 赵正阳 Qi Liuyu;Liu Guodong;Zhao Zhengyang(The 54th Research Institute of CETC,Shijiazhuang 050081,China)
出处 《电子技术应用》 2019年第5期78-80,88,共4页 Application of Electronic Technique
关键词 单粒子效应 Kintex-7 FPGA 加固设计 刷新测试 single event effect Kintex-7 FPGA radiation harden design scrubbing test
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