车辆盲区检测系统硬件在环自动化测试研究

Study of Hardware-in-loop Automatic Testing System for Vehicle Blind Spot Detection System

为了缩短车辆盲区检测系统开发周期,降低开发成本,文章采用NI的硬件架构,以IPG为软件平台构建了盲区检测硬件在环自动化测试系统,全面介绍该自动化测试系统的组成以及工作原理。并在此基础上提出了一种盲区检测系统的硬件在环自动化测试方法,将车辆盲区检测控制器接入到所构建的自动化测试系统中,通过设计测试用例,编辑测试序列并执行,最终生成详细的测试报告完成对盲区检测系统的自动化测试。最后,通过采用本文提出的自动化测试方法,发现了某款车型盲区检测控制器的功能性问题,并且该自动化测试方法相较于传统人工测试方法在测试周期以及成本等方面表现出了极大的优势。

In order to shorten the development cycle of vehicle blind spot detection(BSD)system and reduce the develop-ment cost,a hardware-in-loop(HIL)automatic testing system for BSD system is developed in this paper based on the hardware architecture of NI and the IPG software platform.The composition and working principle of the automatic testing system are introduced.On this basis,a HIL automatic testing method for BSD system is proposed,and the BSD controller is connected to the constructed automatic testing system.Through designing testing cases,editing testing sequences and execution the sequences,a detailed testing report is generated finally to complete the automatic testing for BSD system.Finally,by using the automated test method proposed in this paper,the functional problems of the BSD controller for a certain type of vehicle are founded,and the proposed BSD system HIL automatic testing method shows great advantages over the traditional manual testing method in terms of testing cycle and cost.