基于指数威布尔分布的复杂电子系统使用可靠度建模

Operational Reliability Modeling of Complex Electronic Systems Based on Exponential Weibull Distribution

针对复杂电子系统在使用过程中的可靠度难以确定的问题,提出了基于指数威布尔分布的复杂电子系统使用可靠度建模方法。该方法采用指数威布尔分布来描述复杂电子系统中各单元的寿命分布,可以动态描述系统升级、单元替换、故障维修三种因素影响下的系统可靠度变化。仿真实验结果表明,该方法能够将复杂电子系统在使用过程中的维修维护因素的影响反应到可靠度的变化上,对复杂电子系统使用可靠性分析具有一定的现实意义以及实际应用价值。

Aiming at the problem that the operational reliability of complex electronic systems is difficult to determine in the process of operating,this paper proposes a reliability modeling method based on exponential Weibull distribution for complex electronic systems.This method uses the exponential Weibull distribution to describe the life distribution of each unit in a complex electronic system;it can dynamically describe the system reliability changes under the influence of three factors:system upgrade,unit replacement and fault repair.The simulation results show that the method can reflect the influence of maintenance and maintenance factors of complex electronic systems in the operating process to the change of reliability.It has certain practical significance and practical application value for the operational reliability analysis of complex electronic systems.