摘要
利用4f(f为焦距)系统和电子耦合器件相机跟踪样品的位置,通过纳米平移台对机械漂移进行了补偿,使样品始终处于光片的束腰位置,从而获得了最优图像。所提方法可以对几纳米的机械偏移进行补偿。使用自主搭建的光片荧光显微镜对直径为几微米的荧光微球进行了长时间成像,验证了所提方法的可行性。
By using a 4f(f is the focal length) optical setup and a charge coupled device camera,the sample position is tracked.The mechanical drift is compensated by the nano-translation table which ensures the sample always at the beam waist of the light sheet and thus an optimal image is obtained.With the proposed method,the mechanical drift of several nanometers can be compensated.By using the home-made light sheet fluorescence microscopy,the long-time imaging of fluorescent microspheres with diameters of several micrometers is acquired,which confirms the feasibility of the proposed method.
作者
张球
梁东
白丽华
刘军
Zhang Qiu;Liang Dong;Bai Lihua;Liu Jun(Department of Physics,College of Sciences,Shanghai University,Shanghai 200444,China;State Key Laboratory for High Laser Field Physics,Shanghai Institute of Optics and Fine Mechanics,Chinese Academy of Sciences,Shanghai 201800,China)
出处
《中国激光》
EI
CAS
CSCD
北大核心
2019年第4期271-276,共6页
Chinese Journal of Lasers
基金
国家自然科学基金(61521093
61527821)
上海市自然科学基金(18ZR1413600)
关键词
成像系统
光片荧光显微镜
机械偏移
4f系统
补偿
最优图像
imaging systems
light sheet fluorescence microscopy
mechanical drift
4f optical setup
compensation
optimal image