Ga-In-Sn微型共晶点相变特性研究

Study on Phase Transition Characteristic of Mini Ga-In-Sn Eutectic Fixed Point

以Ga-In-Sn三元合金为研究对象,研制了可用于现场及在线标定的微型Ga-In-Sn共晶点容器,开展了3种不同配比对相变温度和温坪复现影响的研究。结果表明:3种配比的共晶点温坪可持续1. 2～2 h,实验的复现性优于4. 5 m K,合成扩展不确定度为9. 3 m K(k=2),3种配比的共晶点相变温度平均值为10. 748℃;在相同热工况下Ga-In-Sn合金发生共晶反应的相变温度不受配比的影响;改变合金熔体的降温速率可改变微型共晶点过冷度。

Taking Ga-In-Sn ternary alloy as the research object, a mini Ga-In-Sn eutectic cell which can be used for on-site and on-line calibration was developed, and the effect of three-ratio for the Ga-In-Sn on phase transition temperature and temperature plateau were investigated. The results show that the plateaus of three-ratio Ga-In-Sn realization last about 1.2 h to 2 h, the reproducibility is less than 4.5 mK and combined expanded uncertainty is 9.3 mK( k =2). The average value of the phase transition temperature is 10.748 ℃ and is not affected by the ratio of Ga-In-Sn ternary alloy. Changing the melt cooling rate can change the supercooling of the mini eutectic fixed point.