利用精密单点定位技术评估晶振频率稳定度

Evaluation of Crystal Frequency Stability Using Precision Point Positioning Technology

在评估晶振频率稳定度时,目前常用一个频率稳定度比待测晶振高3倍以上的时钟作为参考,造成测试成本高昂。在分析精密单点定位(Precise Point Positioning,PPP)技术原理的基础上,提出了一种基于PPP技术的频率稳定度评估方法,并利用该方法对一款秒稳达到 10 -12 的高稳定度恒温晶振(Oven Controlled Crystal Oscillator,OCXO)进行了评估,评估结果与利用氢原子钟为参考的传统频率稳定度评估方法基本吻合。最后给出了该方法对不同等级晶振的评估能力。该方法结构简单,测试方便且成本低廉,能满足常用时频设备(如通信设备、卫星导航接收机)的晶振评估需求。

At present,the commonly used frequency stability measurement method requires a reference frequency source whose frequency stability is more than 3 times than that of the frequency source to be evaluated,resulting in high test cost.According to the analysis of the principle of precise point positioning(PPP),a method based on PPP technology is proposed for evaluating frequency stability.With this method,a high stability oven controlled crystal oscillator(OCXO) with short stability about 10 -12 is used for frequency stability evaluation and the evaluation results are basically consistent with the traditional frequency measurement method using the hydrogen atomic clock as a reference.Finally,the evaluation ability of the method for different grades of crystal oscillator is given.The method has the advantages of simple structure,convenient testing and low cost,and can meet the crystal evaluation requirements of commonly used time-frequency devices such as communication devices and satellite navigation receivers.