摘要
本文将针对生产制造工艺对LCD端子接触面积的具体影响这个命题,从LCD端子接触面积率描述、LCD端子接触面积存在问题类型、LCD端子接触面域率比例低的原因与控制措施这三个方面来重点阐述,同时本文研究内容也可供相关部门和广大同行借鉴与参考。
This paper will focus on three aspects: the description of LCD terminal contact area rate, the types of LCD terminal contact area problems, the reasons for the low ratio of LCD terminal contact area and the control measures, aiming at the specific impact of manufacturing process on LCD terminal contact area. At the same time, the research contents of this paper can also be used for reference by relevant departments and colleagues.
作者
艾克军
Ai Kejun(Varitronix Group co., LTD.,Heyuan Guangdong,517000)
出处
《电子测试》
2019年第11期65-66,20,共3页
Electronic Test
关键词
制造工艺
LCD
端子接触面积
变形回弹
manufacturing process
LCD
terminal contact area
deformation rebound