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双路扫描式激光测径仪系统设计 被引量:4

Design of Double Scanning Laser Diameter Measuring System
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摘要 针对企业对小型零部件生产线上的工件线径检测精度和稳定性问题,研制了一款基于ARM+FPG A的双路扫描式激光测径系统,用于解决扁平形漆包线线径的精确测量问题。该测径系统采用标准棒法测量原理,运用累加求和取平均值的处理算法,实现了工件线径的厚度和宽度双向检测,克服了单路激光测径系统测量范围受限等缺点。实验结果表明,该测径仪精度可达到0.001 mm,示值误差不超过±0.005 mm,稳定性能好,测量精度高,适合于生产线上小尺寸工件线径的精度检测。由于FPGA的快速数据处理能力,本系统特别适用于动态线材的尺寸监测。 According to the accuracy and stability of workpiece diameter detection in small parts production line, a dual scanning laser diameter measuring system based on ARM + FPGA was developed to solve the problem of accurate measurement of the diameter of flat enameled wire. The diameter measuring system uses the principle of standard bar method to measure the thickness and the width of workpiece diameter by using the algorithm of summation and averaging, which overcomes the shortcomings of limited measurement range of single laser diameter measuring system. The experimental results show that the accuracy of the diameter measuring instrument reaches 0. 001 mm, the indication error does not exceed ± 0. 005 mm, the stability is good and the measurement precision is high. It is suitable for the accuracy detection of the small diameter workpiece line in the production line. Due to the fast data processing capabilities of FPGA, this system is especially suitable for size monitoring of dynamic wires.
作者 康志远 龙威 唐立军 吴定祥 KANG Zhi-yuan;LONG Wei;TANG Li-jun;WU Ding-xiang(Jinweizhou Hydroelectria Power Plant,Wuling Power Corporation Ltd,Changsha 410004,China;School of Physics and Electronia Sciences,Changsha University of Science & Technology,Changsha 410114,China;Changsha Billion Set Electrical Technology Co..Ltd..Changsha 410000,China;Hunan Provincc Highco EducationKey Laboratory of Modeling and Monitoring on the Near-Xarth Electromagnetic Environments,Changsha 410114,China)
出处 《测控技术》 2019年第5期72-76,共5页 Measurement & Control Technology
基金 国家科技支撑计划课题(2014BAH28F04) 湖南省教育厅科学研究重点项目(14C0031 15K009)
关键词 激光测径 ARM+FPGA 双路扫描 标准棒法 laser diameter ARM+FPGA double scanning standard bar method
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