摘要
本文首先总结了光耦失效的几种模式,然后基于线性光耦的工作原理、制程,找出光耦失效的原因,并阐述了在光耦生产过程、光耦应用等环节如何进行调查分析,以期为相关学者的研究提供参考。
Firstly, several modes of photo coupler failure were summarized. Then, based on the working principle and process of linear photo coupler, the causes of photo coupler failure were found out, and how to conduct investigation and analysis in the process of photo coupler production and application of photo coupler were elaborated, in order to provide reference for the research of relevant scholars.
作者
王小龙
冯勇雄
WANG Xiaolong;FENG Yongxiong(Gree Electric Appliances(Zhengzhou) Co.,Ltd.,Zhengzhou Henan 450001)
出处
《河南科技》
2019年第7期63-65,共3页
Henan Science and Technology
关键词
光耦
失效
封装
金线绑定
过电压击穿
photo coupler
failure
packaging
gold wire binding
overvoltage breakdown
