摘要
Shanghai high-repetition-rate XFEL and extreme light facility (SHINE), the first hard XFEL based on a superconducting accelerated structure in China, is now under development at the Shanghai Institute of Applied Physics, Chinese Academy of Sciences. In this paper, power losses caused by trapped longitudinal high-order modes (HOM), steady-state loss, and transient loss generated by untrapped HOMs in the 1.3-GHz SHINE cryomodule are investigated and calculated. The heat load generated by resistive wall wakefields is considered as well. Results are presented for power losses of every element in the 1.3-GHz cryomodule, caused by HOM excitation in the acceleration RF system of the continuouswave linac of SHINE.
Shanghai high-repetition-rate XFEL and extreme light facility(SHINE), the first hard XFEL based on a superconducting accelerated structure in China, is now under development at the Shanghai Institute of Applied Physics, Chinese Academy of Sciences. In this paper,power losses caused by trapped longitudinal high-order modes(HOM), steady-state loss, and transient loss generated by untrapped HOMs in the 1.3-GHz SHINE cryomodule are investigated and calculated. The heat load generated by resistive wall wakefields is considered as well. Results are presented for power losses of every element in the 1.3-GHz cryomodule, caused by HOM excitation in the acceleration RF system of the continuouswave linac of SHINE.
基金
supported by the Frontier Research of Large Science Installation(2016YFA0401902)
the Youth Innovation Promotion Association CAS(No.2018300)
