摘要
采用808nm大功率半导体激光器巴条进行了封装实验,对影响封装质量的两个重要因素,即管炉温度和烧结时间进行了优化。结果表明,在管炉温度为650℃、烧结时间为100s时,焊料层界面空洞最少,半导体激光器巴条的smile效应值最低,阈值电流最小,波长更加稳定,烧结质量最优。
The 808 nm high-power semiconductor laser bars are used for packaging to optimize the two important factors that affect the package quality: the furnace tube temperature and the soldering time. The results show that the solder layer has the least voids when the soldering time is 100 s at a tube furnace temperature of 650 ℃. Moreover, the obtained semiconductor laser bar has the lowest smile effect value, the smallest threshold current, a more stable wavelength, and the best soldering quality.
作者
张秋月
井红旗
袁庆贺
马骁宇
董连和
Zhang Qiuyue;Jing Hongqi;Yuan Qinghe;Ma Xiaoyu;Dong Lianhe(Institute of Opto-Electronics Engineer, Changchun University of Science and Technology,Changchun , Jilin 130022, China;National Engineering Research Center for Optoelectronic Devices, Institute of Sem iconductors,Chinese Academy of Sciences, Beijing 100083, China)
出处
《激光与光电子学进展》
CSCD
北大核心
2019年第9期162-166,共5页
Laser & Optoelectronics Progress
基金
国家自然科学基金(41414010302)