期刊文献+

基于机器视觉的硅片隐裂检测系统的研究

Research on Silicon Hidden Crack Detection System Based on Machine Vision
下载PDF
导出
摘要 隐裂硅片是指存在肉眼不易观察到的隐形裂纹的硅片。隐裂硅片会造成碎片、不良片问题,不仅浪费了能源且加大了人工成本。本文针对太阳能行业的最前道工序制绒段隐裂硅片问题,设计了应用于自动化制绒上料机的在线视觉检测系统。工业现场应用表明,在线视觉检测装置的应用大大降低了碎片率。研发经验与历程对相关应用有借鉴作用。 The hidden cracked silicon wafer refers to a silicon wafer with invisible cracks that are difficult to observe by the naked eye.The hidden cracked silicon wafers can cause debris and bad film problems,which not only wastes energy but also increases labor costs.This paper designs an online visual inspection system for automatic cashmere feeders for the problem of hidden cracked silicon wafers in the front-end process of the solar industry.Industrial field applications show that the use of online visual inspection devices has greatly reduced the fragmentation rate.R&D experience and history can be used as reference for related applications.
作者 穆星泽 段建国 Mu Xingze;Duan Jianguo(The 2nd Research Institute of China Electronics Technology Group Corporation,Taiyuan Shanxi 030024,China)
出处 《山西电子技术》 2019年第3期94-96,共3页 Shanxi Electronic Technology
关键词 隐裂硅片 在线视觉检测装置 碎片率 hidden cracked silicon wafer online visual inspection device fragmentation rate
  • 相关文献

参考文献2

二级参考文献10

共引文献17

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部