窄脉冲阵列激光器峰值功率测试的研究

Study on the technique for measuring the peak power of narrow pulsed semiconductor laser arrays

窄脉冲半导体激光器阵列输出的峰值功率必须准确测量,测量精度直接关系到光电系统的质量。本文介绍一种基于对数放大技术和8051F020单片机,采用脉冲展宽和峰值保持原理,通过快速放电复零从而直接测量窄脉冲阵列半导体激光器峰值功率的方法。测试结果表明,标定误差小于3%,测量准确度高,重复测量误差都在±1.7%之内。该测量方法研制的仪器具备便携、测试速度快、成本低的特点,并具有波形输出接口,适合空间有限的快速检测需求。

The peak power of narrow pulsed semiconductor laser arrays should be measured accurately,and the measurement accuracy is directly related to the quality of photoelectric system.In this paper,a measurement technique for measuring the peak power of narrow pulsed semiconductor laser arrays is proposed.The technique collect the data by logarithmic amplification technology and 8051F020 single chip microcomputer.The peak power is measured directly by broadening pulse width,holding peak and resetting with discharging rapidly.The test results show that the calibration error is less than 3%,the measurement accuracy is high,and the repeated measurement error is within 1.7%.The instrument developed by this method has the characteristics of portability,fast test speed and low cost,and has waveform output interface,which is suitable for the rapid test with limited space.