摘要
用MonteCarlo程序(MCNP)模拟主探头外包NaI(Tl)晶体构成阱型反Compton谱仪的输出谱.通过调整FU卡参数,实现对外探测器中脉冲高度的筛选,给出反Compton抑制谱和Compton电子谱,验证MCNP的FU卡在反符合测量中的使用方法,并分析外探测器厚度对反Compton谱的影响。
Monte Carlo program was used to simulate the output spe ctrum of a well-type anti-Compton spectrometer with the main probe wrapped with NaI(Tl) crystal. We gave the anti-Compton suppression spectrum and Compton electron spectrum by adjusting the parameters of the FU card to screen the pulse height of the external detector. The usage method of FU card of MCNP in anti-coincidence measurement was verified,and the effect of the th ickness of external detector on anti-Compton spectrum was analyzed.
作者
刘珉强
杜川华
马玉刚
LIU Minqiang;DU Chuanhua;MA Yugang(Institute of Electrical Engineering,China Academy of Engineering Physics,Mianyang 621000,Sichuan Province,China;College of Physics,Jilin University,Changchun 130012,China)
出处
《吉林大学学报（理学版）》
CAS
北大核心
2019年第4期947-950,共4页
Journal of Jilin University:Science Edition
基金
装备预研领域基金(批准号:6140A24020105
6140A24030311)
