基于二维码的半导体芯片测试信息自动化识别及追溯系统的设计与应用

Design and Application of Automatic Identification and Traceability System for Semiconductor Chip Test Information Based on 2D Code

在半导体芯片研发周期及生产过程中,在最终测试环节保持每颗芯片测试结果的可追溯性具有重要意义。传统方法是通过人工标记或者芯片唯一电子身份码(ECID)进行识别,但这两种方法都具有很大的局限性。为此介绍一种创新性的基于多摄像头、特定波长光源、个人电脑及相应软件算法的芯片表面印刷二维码自动识别及追踪系统的设计及其应用范围,此系统克服了传统方法的局限性,具有应用广泛、操作灵活简单、可靠性高等特点。

In the semiconductor chip development cycle and production process,it is important to maintain traceability of test results of each chip in the final test.The traditional method is to identify by manual marking or Exclusive Chip Identification(ECID),but both methods have significant limitations.This paper introduces the design and application of an innovative automatic identification and tracking system for printed 2D code on chip surface,which is based on multiple cameras,special wavelength light source,personal computer as well as corresponding software algorithms.This system overcomes the limitations of traditional methods and has the characteristics of wide application,flexible operation and high reliability.