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阻变存储器阻变层材料专利技术综述

Summary of Patented Technology for Resistive Random Access Memory Resistive Layer Materials
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摘要 阻变存储器是最具潜力的下一代非易失性存储器之一。本文从专利角度分析了阻变存储器阻变层材料相关专利申请的基本状况,分别对金属氧化物、固态电解质、有机物三种重要阻变层材料技术分支的重点专利进行分析,对各分支的技术内容进行详细梳理,分析其技术演进趋势,探索阻变存储器阻变层材料技术未来的发展方向。 Resistive random access memory is one of the most promising next-generation non-volatile memories. This paper analyzed the basic status of patent applications related to resistive memory resistive layer materials from the perspective of patents.The key patents of several important resistive layer material technologies of metal oxides, solid electrolytes and organic materials were analyzed respectively.The technical contents of each branch were analyzed in detail,and the technological evolution trend was analyzed to explore the resistance memory technology,and the future development direction of resistance layer material technology of resistance memory was explored.
作者 黄晓亮 田凌桐 王文晓 孟圆 HUANG Xiaoliang;TIAN Lingtong;WANG Wenxiao;MENG Yuan(Patent Examination Cooperation (Henan) Center of the Patent Office,CNIPA,Zhengzhou Henan 450002)
出处 《河南科技》 2019年第13期8-11,共4页 Henan Science and Technology
关键词 阻变层 金属氧化物 固态电解质 有机材料 resistive layer metal oxide solid electrolyte organic
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  • 1SIMMONS J,VERDERBER R.New conduction and reversible memory phenomena in thin insulating films[J].P Roy Soc Lond A Mat,1967,301(1464):77-102.
  • 2LIU S Q,WU N J,IGNATIEV A.Electric-pulse-induced reversible resistance change effect in magnetoresistive films[J].Appl Phys Lett,2000,76(19):2749-2751.
  • 3ZHUANG W W,PAN W,ULRICH B D,et al.Novel colossal magnetoresistive thin film nonvolatile resistance random access memory (RRAM)[C] // Int Elec Dev Meet.San Francisco,CA,USA.2002:193-196.
  • 4KIM D C,SEO S,AHN S E,et al.Electrical observations of filamentary conductions for the resistive memory switching in NiO films[J].Appl Phys Lett,2006,88(20):202102.
  • 5KINOSHITA K,TAMURA T,AOKI M,et al.Bias polarity dependent data retention of resistive random access memory consisting of binary transition metal oxide[J].Appl Phys Lett,2006,89(10):103509.
  • 6CHOI B J,CHOI S,KIM K M,et al.Study on the resistive switching time of TiO2 thin films[J].Appl Phys Lett,2006,89(1):012906.
  • 7CHEN A,HADDAD S,WU Y C,et al.Non-volatile resistive switching for advanced memory applications[C] // Int Elec Dev Meet.Washington D C,USA.2005:765-768.
  • 8LEE D,CHOI H,SIM H,et al.Resistance switching of the nonstoichiometric zirconium oxide for nonvolatile memory applications[J].IEEE Elec Dev Lett,2005,26(10):719-721.
  • 9SIM H,CHOI D,LEE D,et al.Resistance-switching characteristics of polycrystalline Nb2O5 for nonvolatile memory application[J].IEEE Elec Dev Lett,2005,26(5):292-294.
  • 10KOZICKI M N.Memory devices based on solid electrolytes[C] // Mater Res Soc Symp Proc.Warrendale,PA,USA.2007:165-174.

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