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稀土稳定四方多晶氧化锆陶瓷相变微结构的表征 被引量:3

Characterization of Microstructure and Phase Evolution in Co-doped Zirconia Ceramics
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摘要 基于扫描电镜搭建的表征技术与分析方法集约研究平台,针对钕钇共掺氧化锆陶瓷开展了相变微结构的系统性定量研究。在推进抛光、成像、能谱及背散射通道衍射等技术的协同运用与集成发展的过程中,逐步探讨四方多晶氧化锆陶瓷的复相关系及相变行为。对比分析得到了适用于相鉴别和能谱定量分析的最佳制样方法,并研究了束斑扩展效应对能谱定量结果的影响,进一步结合二次电子和背散射电子成像及分析以解析双相氧化锆陶瓷的相变诱发行为。定量微结构与相关系研究的结合,不但揭示了烧结过程的微观图像,对相变机理的理解及调控也提供了新的可能。 A quantitative study on Nd/Y co-stabilized ZrO2 ceramics was carried out by scanning electron microscopy(SEM). The transformable microstructure of a dual-phased TZP ceramic was analyzed by electron backscatter diffraction(EBSD) and energy dispersive spectroscopy(EDS). The optimal sample preparation methods for EBSD and EDS quantitative analysis were obtained, and a beam expansion effect on the quantitative EDS analysis was also investigated, revealing a two-level distribution of stabilizers in consistence with the dual-phase relationship. In combination of the phase analysis especially with their different behaviors in secondary electron and back-scattered electron imaging(SE/BSE) modes, the transformation process induced by a sample polishing process was rationalized for the transformable TZP ceramic. The results can shed a light into the stress-induced phase transformation behavior of dual-phase ZrO2 to clarify their sintering process and further tailor the transformable microstructure for the better performance.
作者 陈威 胡冬力 顾辉 邢娟娟 CHEN Wei;HU Dongli;GU Hui;XING Juanjuan(Materials Genome Institute,School of Materials Science and Engineering,Shanghai University,Shanghai 200444,China)
出处 《硅酸盐学报》 EI CAS CSCD 北大核心 2019年第8期1057-1064,共8页 Journal of The Chinese Ceramic Society
基金 国家自然科学基金资助项目(51532006) 上海市科学技术委员会(16DZ2260601)和111项目(D16002)
关键词 四方多晶氧化锆陶瓷 扫描电子显微镜 能谱仪 离子刻蚀 相变 tetragonal polycrystalline zirconia ceramics scanning electron microscopy energy dispersive spectrometer ion-beam etching phase transformation
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  • 1余天博,Godfrey A,刘伟,等.EBSD衍射花样质量在材料科学中的应用[C]//第二届全国电子背散射衍射技术及其应用会议论文集.包头:中国体视学学会材料科学分会,2007,65-67.
  • 2Schwartz A, Knmar M, Adams B. Electron Backscatter Diffraction in Materials Science[ M ]. New York : Kluwer! Plenum, 2000.
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  • 5黄亚敏,潘春旭.基于电子背散射衍射(EBSD)技术的材料微区应力应变状态研究综述[J].电子显微学报,2010,29(1):1-11. 被引量:23

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