相控阵双全法改善缺陷表征

Phased Array FMC-TFM Techniques for Improving Defect Characterization

与常规技术相比,相控阵超声检测(PAUT)优势凸现:速度快,可靠性好,灵敏度高,分辨力优。应对复杂检测,PAUT总是首选技术。随着计算功效强化,新一代超声设备管控大数据能力优化,"双全"法-全矩阵捕获(FMC)和全聚焦法(TFM)等先进成像技术,应运而生。结合标准许可的方法使用,这些技术可使缺陷表征大为改善。本文即论证相控阵检测与先进成像法相结合,如何为UT日常应用,强化缺陷表征过程。

Compared with conventional techniques,Phased Array Ultrasonic Testing(PAUT)has demonstrated many advantages:fast,reliable,with higher resolution and sensitivity.It is now always considered as the go-to technique for complex inspections.With increased computing power and better capability to manage large data set of new generation ultrasonic equipment,advanced imaging techniques like Full Matrix Capture and Total Focusing Method(FMC-TFM)are now available.Used in conjunction with standards-approved method,they can obviously improve defects characterization.This article will demonstrate that the combination of Phased Array inspection with advanced imaging techniques,can enhance the defects characterization process for common applications of UT.