摘要
本文从宏观、微观以及综合指标因素三维度对企业主体走出去可能存在的技术风险进行全面、准确、快速聚焦定位,并且构建专利预警模型,通过模型计算分析,得到各个技术方向存在的海外专利风险等级;既从宏观或微观单方面角度管窥风险,又从多指标因素来科学评定风险等级,克服了单因素分析带来的不全面性缺陷,同时又避免了超多因素综合分析带来的混沌效应,从单因素和多因素两个方面共同聚焦海外专利风险。
This paper comprehensively, accurately and rapidly focuses and locates the technical risks from three dimensions of macro, micro and comprehensive index factors when the enterprises are going into international market, and constructs a patent pre-warning model, through calculation and analysis of model, it will obtain an overseas patent risk level at each technical direction, not only do we have a view of risks from macro or micro one-sided perspective, but also scientifi cally assess the risk level from multi-index factors, overcoming the incomplete defects brought by single-factor analysis, while avoiding the mixed washings brought by super multi-factor comprehensive analysis, and focusing on overseas patent risks from both single-factor and multi-factors aspects.
作者
袁任远
于志辉
YUAN Renyuan;YU Zhihui(Patent Examination Cooperation (Beijing) Center of the Patent Office, CNIPA, Beijing 100160;Patent Examination Cooperation (Hubei) Center of the Patent Office, CNIPA, Wuhan 430073)
出处
《中国发明与专利》
2019年第9期98-102,111,共6页
China Invention & Patent
关键词
海外专利预警
综合指标
预警模型
预警等级
层次分析法
overseas patent pre-warning
comprehensive index factors
pre-warning model
prewarning level
analytic hierarchy process