拓扑绝缘体界面的透射极化旋转

Transmission Polarization Rotation of Topological Insulator Interface

为了进一步认识拓扑绝缘体的光学特性,根据琼斯矢量法,取不同介电常数和拓扑磁电极化率,分别对拓扑绝缘体透射的极化旋转和相位差进行了计算。研究结果表明,拓扑绝缘体表面的透射特性与普通绝缘体不同,其透射光的极化旋转受材料参数和拓扑磁电极化率影响。发生全反射时,透射光的相位差值变为随入射角改变,且与透射旋转情况不同,透射相位差不受拓扑磁电极化率的影响。拓扑绝缘体的独特磁电响应使其未来有望应用于量子计算以及光学领域。

In order to further understand the optical properties of topological insulator, by using the Jones vector method and taking different dielectric constants and values of the topological magnetoelectric polarizability, the transmission polarization rotation and phase difference of topological insulator are calculated. The experiment results indicate that the transmission characteristics of topological insulator surface are different from those of ordinary insulator, and its transmission polarization rotation is affected by material parameters and topological magnetoelectric polarizability. When total reflection occurs, the phase difference of the transmitted light changes with the incident angle, and unlike the transmission rotation, the transmission phase difference is not affected by the topological magnetoelectric polarizability. The unique electromagnetic response of topological insulator is expected to be applied to quantum computing and optical field in the future.