超大规模集成电路的板级测试研究

Research on Plate-Level Test of VLSI

为检测以超大规模集成电路为核心的电子设备,设计了基于边界扫描技术的电路测试系统。对超大规模集成电路进行板级测试,并提出在互连网络两端的边界扫描单元分别做输出操作的针对互连测试和簇测试过程的测试方法。测试结果表明:利用该方法,提高了超大规模集成电路板级故障的分辨能力,获得了更好的测试效果。

In order to detect the electronic equipment with VLSI as the core,a set of circuit testing system based on boundary-scan technology was designed,the plate-level test of VLSI was carried out,and an effective test method for interconnection testing and cluster testing is proposed,in which the boundary scan units at both ends of the interconnection network were used for output. The test results showed that the test system by using this testing methods,improved the resolution of the plate-level fault of VLSI,and better test results was obtained.