一种基于二次分配的测试性指标分配方法

A testability index allocation method based on quadratic allocation

针对现有主流测试性分配方法均为一次性分配,缺乏必要的反馈和修正,一旦有单元分配指标过高无法实现,会导致系统指标也无法实现的问题,提出了一种基于二次分配的测试性指标分配方法。利用基于反正切函数的改进故障率分配法实施初次分配,由单元开展测试性初步设计和预计,基于单元测试性指标预计结果判断是否需要实施再次分配,如需要再次分配,则基于单元相对难度系数的修正函数,对指标偏高/偏低的单元实施再次分配,得到最终分配结果。通过仿真算例和实例验证了二次分配方法的有效性和先进性。

The existing mainstream testability allocation methods are all one-time allocation, without feedback and modification. Once the unit allocation index is too high to achieve, the system index cannot be achieved. Therefore, a testability allocation method based on quadratic allocation is proposed. First, an improved fault rate allocation method based on arctangent function is proposed to implement the primary allocation. Second, the preliminary design of testability and testability prediction are successively implemented to determine whether the secondary allocation is required. If it's required, an amending function based on the relative difficulty coefficient is proposed to implement the secondary allocation and obtain the final allocation result. Finally, the effectiveness and advancement of the quadratic allocation method are verified by simulation calculation and practical application.