万年历芯片DS1302功能测试方法研究

Research on Functional Testing Method of Perpetual Calendar Chip DS1302

为完成集成电路芯片DS1302的功能测试工作,利用计算机辅助测试技术,搭建测试系统。系统硬件采用计算机、单片机、被控芯片三级相连结构,软件采用C#编写的上位机程序和C语言编写的下位机程序,两者之间按照约定的通讯协议进行交互,并计算机作为上位机,单片机作为下位机。待测试的被控芯片接收主控芯片的命令,返回信息给主控芯片。经过长期实测检验,证实该套测试系统能够缩短集成电路芯片DS1302的测试时间,提高测试准确度,达到了预期目的,且具有一定的可移植性。

In order to complete the functional test of the integrated circuit chip DS1302, a test system is built using computer-aided test technology. The hardware of the system adopts a three-level connection structure of a computer, a singlechip and a controlled chip. The software adopts an upper computer program written by C# and a lower computer program written by C language. The two interact according to the agreed communication protocol, and the computer serves as the upper computer while the singlechip serves as the lower computer. The controlled chip to be tested receives the command from the main control chip and returns information to the main control chip. After long-term testing, it is proved that the test system can shorten the test time of integrated circuit chip DS1302, improve the test accuracy, achieve the expected purpose, and has certain portability.