摘要
通过光耦使用过程的数据统计,内部结构分析,失效机理研究,结合光耦应用环境,对影响其质量可靠性的因素进行全面分析,最终找到光电耦合器铝电极开路的产生原因是酸腐蚀,并给出了初步的整改对策。通过此项问题的研究,对全面、系统化提升器件本身质量可靠性起到了重要作用。
Based on the data statistics,internal structure analysis,failure mechanism research and the application environment of optocoupler,the factors affecting the quality and reliability of the optocoupler are analyzed comprehensively. Finally,acid corrosion is found to be the cause of the open circuit of the aluminium electrode of the optocoupler,and the preliminary rectification measures are given.Through the research of this problem,it plays an important role in improving the quality and reliability of the device itself comprehensively and systematically.
作者
施庆西
王陆宾
王耐东
于海泳
SHI Qing-xi;WANG Lu-bin;WANG Nai-dong;YU Hai-yong(Gree Electric(Zhengzhou)Co.,Ltd.,Zhengzhou 450001,China)
出处
《通信电源技术》
2019年第10期219-220,共2页
Telecom Power Technology
关键词
光电耦合器
铝电极
腐蚀
开路
photocoupler
aluminum electrode
corrosion
open circuit