用PLD实现VXI自动测试系统测试接口设计

Use PLD to Realize the Design of ATS Test Interface Based on VXI-bus

在基于VXI总线自动测试系统中,针对某大型电子装备多种被测组合综合测试问题,采用可编程逻辑器件（PLD）技术实现了灵活性强、可靠性高、成本低廉的VXI总线测试接口的设计,并通过测试信号的动态分配、动态上拉和动态预处理等方法,有效地解决了测试平台对多种复杂被测对象的适配问题。

Based on VXI bus ATE , this paper achieved the design of the flexible , good dependability and cheap VXI ATS interface for the test of combinations of some big electronic equipment by using the PLD technique , and solved the problem on adapting to various units under test (UUT) on the testing plat effectively by using the methods of signal dynamic assignments, dynamic pull up and dynamic pre-processes.