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Parameter Test of ROIC for IRFPA Based on Virtual Instrument Technology

Parameter Test of ROIC for IRFPA Based on Virtual Instrument Technology
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摘要 The readout integrated circuit (ROIC) technology is one of the critical technologies in the research of an infrared focal plane array (IRFPA). Based on the virtual instrument technology, a system for parameter test of ROIC is developed for IRFPA. The complex programmable logic device (CPLD) is applied into the system to increase its flexibility. With high reliability and precision, along with the integrated software and hardware environment, the system can test all kinds of ROICs. The readout integrated circuit (ROIC) technology is one of the critical technologies in the research of an infrared focal plane array (IRFPA). Based on the virtual instrument technology, a system for parameter test of ROIC is developed for IRFPA. The complex programmable logic device (CPLD) is applied into the system to increase its flexibility. With high reliability and precision, along with the integrated software and hardware environment, the system can test all kinds of ROICs.
出处 《Semiconductor Photonics and Technology》 CAS 2001年第3期150-154,162,共6页 半导体光子学与技术(英文版)
关键词 Virtual instruments ROIC IRFPA CPLD 虚拟仪器 读出集成电路 复杂可编程逻辑器 红外焦平面列车
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参考文献3

  • 1Yuan Xianghui,半导体光电,1999年,20卷,2期,123页
  • 2Jia Gongxian,电子技术应用,1999年,25卷,12期,4页
  • 3Han Jianzhong,激光与红外,1998年,28卷,5期,273页

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