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Analysis of surface damage produced by pulsed laser ablation on metal Al and semiconductor Si 被引量:1

Analysis of surface damage produced by pulsed laser ablation on metal Al and semiconductor Si
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摘要 The surface morphological changes produced by Nd:YAG pulsed laser ablation of metal Al and semiconductor Si were carefully examined and analyzed by using scanning electron microscope. The formation mechanism of the droplets was discussed, and the reasons for formation of the microcracks on the laser irradiated area of the target surface were analyzed by calculating the thermal stress, the vapor pressure and the shock pressure induced by the laser supported detonation. The surface morphological changes produced by Nd:YAG pulsed laser ablation of metal Al and semiconductor Si were carefully examined and analyzed by using scanning electron microscope. The formation mechanism of the droplets was discussed, and the reasons for formation of the microcracks on the laser irradiated area of the target surface were analyzed by calculating the thermal stress, the vapor pressure and the shock pressure induced by the laser supported detonation.
出处 《Nuclear Science and Techniques》 SCIE CAS CSCD 1998年第2期98-101,共4页 核技术(英文)
关键词 金属铝 半导体硅 脉冲激光烧蚀 表面损伤 Laser damage, Thermal stress, Shock pressure
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