边界扫描测试中簇测试交迭置入方案研究

A Study on the Overlapped Application Scheme of Clusters Testing in Boundary Scan Testing

针对电路板边界扫描测试中簇测试时间较长、测试效率较低问题 ,以并行测试思想为基础 ,提出了一种簇测试置入方案———交迭置入方案 ,并对其进行了理论分析和实验验证。结果表明 ,该方案是最优的簇测试置入方案 ,可以显著减小簇测试时间 。

Aiming at the time consuming problem of clusters testing in boundary scan testing of circuit boards, an application scheme of clusters testing-the overlapped application scheme is proposed based on 'parallel testing'. Theoretical analysis and experiments show that this scheme is the best testing application scheme and can reduce the clusters testing time greatly.