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电荷注入检测器电感耦合等离子体光谱仪测定非金属元素的分析性能 被引量:8

Analytical Performance of Inductively Coupled Plasma Atomic Emission Spectrometer with Charge Injection Device for the Determination of Non-metal Elements
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摘要 研究了电荷注入检测器ICP光谱仪测定非金属元素的分析性能。以S、P、As、Se为代表的非金属元素在 1 70~ 80 0nm波段内最灵敏的谱线均处于 1 75~ 2 0 0nm远紫外区内。在此区内等离子体有很低的光谱背景发射和良好的谱线测量和背景测量的光度精度。标准曲线线性动态范围在 4个数量级。给出了As、Se、S、P主要分析线的灵敏度、线背比、背景等效浓度及检出限。在纯水溶液中的检出限分别为 :As 1 89.1 4 2nm 0 0 0 3mg L,P 2 1 3 .61 8nm 0 .0 0 5mg L ,S 1 80 .73 1nm 0 .0 1mg L ,Se 1 96.0 90nm 0 .0 0 9mg L。 Analytical performance for the detection of non-metal elements by inductively coupled plasma atomic emission spectrometer (ICP-AES) with charge injection device ( CID) was investigated. The experimental results showed that the photometric precision of determination of spectral lines and background were excellent for S, P, As and Se. The linear range of calibration curves was 0.03 mg/L to 1000 mg/L for As, and 0.1 mg/L to 1000 mg/L for P, 0.3 mg/L to 1000 mg/L for S, and 1.0 mg/L to 1000 mg/L for Se. The detection limits were 0. 003 mg/L for As, 0. 005 mg/L for P, 0. 01 mg/L for S, 0. 009 mg/L for Se. The information about the determination of nonmetals such as sensitivity, line-to-background ratio, equivalent concentration of background was examined.
出处 《分析化学》 SCIE EI CAS CSCD 北大核心 2002年第11期1375-1378,共4页 Chinese Journal of Analytical Chemistry
关键词 电感耦合等离子体光谱仪 测定 非金属元素 分析性能 电荷注入检测器 光谱分析 inductively coupled plasma-atomic emission spectrometry non-metal elements sulfur phosphorus arsenic selenium charge injection device
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