X射线衍射法测定分子筛硅铝比与结晶度

Determination of Crystallinity and Si-to-Al Ratio of Synthetic Molecular Sieve by X-Ray Diffraction

用X射线衍射外推函数法测定饱和吸水前后NaY分子筛的晶胞参数和结晶度 ,经晶胞参数与2 9Si、 2 7Al固体魔角核磁共振谱仪测定NaY分子筛骨架中的硅铝比关联的经验公式 ,得到的X射线衍射法测定NaY分子筛骨架中硅铝比的分析方法 ,以便满足NaY分子筛骨架中硅铝比测定工作的需要。结果表明 ,测定NaY分子筛硅铝比、晶胞参数和结晶度的有效方法是在测定前对分子筛进行稳化处理 。

The lattice constant and crystallinity of NaY molecular sieve before and after absorbing water were determined with extension function method of X-ray diffraction.By relating the lattice constant to the framework Si-to-Al ratio of NaY molecular sieve determined by solid nuclear magnetic resonant spectrum method, an empirical formula was gotten with which the Si-to-Al ratio can be obtained from the lattice constant.The results show that the method is simpler and more convenient,and has better repeatability than that of the chemical analysis methods, before determination the molecular sieve must be treated for stabilization in order to let it saturated by water.