集成电路在要害系统应用的相关技术
Technology about IC in critical application
摘要
介绍了IC在要害系统的应用现状。对IC在要害系统的应用特点、应用策略、相关支持技术、IC的失效分析及故障测试技术进行了探讨。该技术对在要害系统IC的使用者会有很大的帮助。
The present situation of IC used in critical application is introduced. Thecharacteristics, strategies,some sustaining technologies in critical application, IC failure analysis,fault testing are also discussed. These technologies are helpful for users in IC critical application.
出处
《半导体技术》
CAS
CSCD
北大核心
2003年第1期16-19,共4页
Semiconductor Technology
参考文献9
-
1[1]Roadmap Organation Committee. Technology roadmap for integrated circuits used in critical applications.Sandia National Laboratories and University of Maryland, 1998 ,7-10.
-
2[2]ANDERSON R E, SODEN J M, HENDERSON C L. Future technology challenges for failure analysis. Sandia National Laboratories ,1997, 5: 4-5.
-
3[3]COLE E I Jr, SODEN J M. Transient power supply voltage analysis for detecting defects . Electronics Quality/Reliability Center Sandia National Laboratories and University of New Mexico, 1997, 5.
-
4[4]COLE E I Jr, SODEN J M, RIFE J L. Novel failure analysis techniques using photon probing optical microscope. Electronics Quality/Reliability Center Sandia National Laboratories and University of New Mexico , 1997, 5: 5-8.
-
5[5]JIANG W L. IC test using the energy consumption ratio[J]. IEEE Transactions on Computer-Aided Circuits and Systems , 2000,(1): 129-132.
-
6[6]RAJSUMAN R. IDDQ testing for CMOS VLSI[J]. Proceedings of the IEEE, 2000, 88 (4): 545-551.
-
7[7]HAEHN S. Failure analysis of VLSI by IDDQ testing[J].Journal of Electronic Testing, 1997, 11: 273.
-
8[8]WEBER W W. Incorporating IDDQ testing with BIST for improved coverage: An experimental study[J].Journal of Electronic Testing ,1997, 11: 147-148.
-
9[9]MIURA Y. An IDDQ sensor driven by abnormal IDDQ.IEICE Trans Ine & Syst, 2000, E83-D (10).1860-1861.
-
1曾庆光.Visual Basic在数控冲程序编写中的应用[J].CAD/CAM与制造业信息化,2005(11):85-85.
-
2张豫进.如何推进中小城市金融IC卡应用[J].中国信用卡,2013(6):47-49.
-
3冯锡增.关于“反思”[J].世界广播电视,2006,20(1):83-83.
-
4许伟达.IC测试原理[J].半导体技术,2006,31(4):284-286. 被引量：7
-
5张建军.Inventor iLogic应用二例[J].CAD/CAM与制造业信息化,2012(6):35-38. 被引量：1
-
6技术[J].中国公共安全,2007,0(04B):28-29.
-
7王懋庆.电话机IC应用技术专栏（三）：一种廉价的蜂窝...[J].领航半导体及其应用,1991(1):1-5.
-
8刘哲民.电话机IC应用技术专栏（三）：国内外无绳电话面面观[J].领航半导体及其应用,1991(1):18-24.
-
9石英,黄霞,张冰洋.基于DSP的通用图像处理ASIC测试平台设计[J].信息通信,2015,28(7):65-66.
-
10真正的智能工厂[J].现代制造,2016,0(15):3-3.
