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扩展OSL方法校准微波双口测试夹具 被引量:3

The Extended OSL Method for Calibrating the Tow-Port Microwave Test Fixtures
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摘要 常规的OSL(open short load)校准方法具有简便易行的特点 ,被广泛应用于单端口测量的测试夹具的校准 .在本文中 ,OSL方法被首次扩展应用于双端口夹具的校准 ,并消除该方法带来的相位不确定问题 .通过实验证明这种方法与SOLT(short open load thru) The open short load(OSL)method is very simple and widely used for one port test fixture calibration.In this paper,this method is extended to the calibration of two port test fixtures for the first time.The problem of phase uncertainty arising in this application has been solved.The comparison between our results and those obtained with the short open load thru(SOLT)method shows that the method established is accurate enough for practical applications.
出处 《电子学报》 EI CAS CSCD 北大核心 2002年第11期1711-1714,共4页 Acta Electronica Sinica
基金 国家杰出青年科学基金 (No.6982 51 0 9)
关键词 扩展OSL方法 校准 微波双口测试夹具 微波网络分析仪 散射参数测量 相位不确定性 calibration microwave network analyzer scattering parameter measurement phase uncertainty
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  • 1[1]R L Vaitkus.Wide-band de-embedding with a short,an open,and a through line[J].Proceedings of the IEEE,1986,74(1):71-74.
  • 2[2]G F Engen,et al.Thru-reflect-line:An improved technique for calibrating the dual six-port automatic network analyzer[J].IEEE Trans Microwave Theory Tech,1979,27(12):987-993.
  • 3[3]C A Hoer,et al.On-line accuracy assessment for the dual six-port ANA:Extension to nonmating connectors[J].IEEE Trans Instrument Meas,1987,36:524-529.
  • 4[4]N H Zhu,et al.Correlation of calibration equations for text fixtures[J].IEEE Trans Microwave Theory Tech,1999,47(10):1949-1953.
  • 5[5]N R Franzen,et al.A new procedure for system calibration and error removal in automated S-parameter measurements[A].Proc 5th European Microwave Conf.[C].Hamburg,Germany:1975.67-73.
  • 6[6]H -J Eul,et al.Thru-match-reflect:One result of a rigorous theory for de-embedding and network analyzer calibration[A].Proc 18th European Microwave Conf[C].Stockholm,Sweden:1988.909-914.
  • 7[7]H-J Eul,et al.A generalized theory and new calibration procedures for network analyzer self-calibration[J].IEEE Trans.Microwave Theory Tech,1991,39(4):724-731.
  • 8[8]K J Silvonen.A general approach to network analyzer calibration[J].IEEE Trans.Microwave Theory Tech,1992,40(4):754-759.
  • 9[9]K J Silvonen.Calibration of test fixtures using at least two standards[J].IEEE Trans Microwave Theory Tech,1991,39(4):624-630.
  • 10[10]R A Speciale.A generalization of the TSD network-analyzer calibration procedure,covering n-port scattering-parameter measurements,affected by leakage errors[J].IEEE Trans Microwave Theory Tech,1977,25(12):1100-1115.

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