摘要
讨论了SiC晶体升华法生长机理。从SiC晶体生长过程中的化学反应,热传输,物质传输以及缺陷的形成等方面进行了探讨。分析了化学计量比和保护气体压力对SiC单晶生长及其缺陷形成的影响。通过分析得到,要获得高质量的SiC单晶,必须有效地控制各种工艺参数。
SiC crystal growth by sublimation method is discussed with emphasis on chemical reactions, thermal transfer, mass transfer and defect formation during sublimation growth of SiC. The effects of stoichiometric proportion and ambient gas on crystal SiC, especially on the defects of SiC, were analyzed. Efficient control of the parameters of growing process is important to the crystal SiC quality.
出处
《电子元件与材料》
CAS
CSCD
北大核心
2002年第12期17-19,共3页
Electronic Components And Materials
关键词
碳化硅升华法生长
热传输
物质传输
缺陷
化学计量化
保护气体压力
growth of SiC crystal by sublimation
thermal transference
mass transference
defect
stoichiometric proportion