X射线荧光光谱测定石墨烯粉体中的杂质元素

Measurement of Impurity Elements in Graphene Powder Using X Ray Fluorescence

石墨烯粉体是我国已具备规模化生产能力的主要石墨烯材料,针对其关键物理化学特性建立准确可靠的测量方法极为重要.开发了一种利用X射线荧光光谱(XRF)技术对石墨烯粉体中杂质进行快速、无损分析的检测方法,可实现对石墨烯粉体产品质量的便捷初判.研究了石墨烯粉体样品的不同测试形态,并通过将XRF测量结果与电感耦合等离子体-原子发射光谱(ICP-OES)、电感耦合等离子体-质谱(ICP-MS)和X射线能谱(EDX)等检测技术的测量结果进行对比,结果表明XRF可对石墨烯粉体样品中的非金属杂质S、Cl、Si、P及金属杂质Na、Mg、Ca、Fe、Cu、Ti、W、Cr等可靠检出,可实现对石墨烯粉体中杂质元素的快速、简便、无损低成本的定量测量.

A simple and nondestructive measurement method has been developed to measure the main impurities in graphene powder.The measurement results of X ray fluorescence spectrum(XRF)and several test techniques of inductively coupled plasma-optical emission spectrum(ICP-OES),inductively coupled plasma-mass spectrometry(ICP-MS)and energy dispersive X-ray(EDX)etc.were compared in detail.It is confirmed that the main non-metallic impurities,S,Cl,Si,P,and the metallic impurities,Na,Mg,Ca,Fe,Cu,Ti,W,Cr etc.,can be detected accurately and reliably using XRF.So that XRF can realize the rapid,feasible,non-destructive,and low-cost quantitative measurement of the main impurities in graphene powder once certified reference material(CRM)of the chemical composition of graphene is developed.