基于分类算法的集成电路芯片缺陷分析

Analysis of IC Chip Defects Based on Classification Algorithms

从电路故障检测的研究现状、硬件木马检测的研究现状入手,介绍缺陷检测技术的研究现状。基于小波分析的特性提取方法,分析了集成电路芯片的硬件故障分类方法。研究硬件电路故障分类的仿真实验。总结集成电路芯片的硬件故障分类方法对分析硬件缺陷带来的积极影响。

Starting from the research status of circuit fault detection and hardware Trojan horse detection,this paper introduces the research status of defect detection technology.Based on the feature extraction method of wavelet analysis,it analyses the hardware fault classification method of integrated circuit chips.It studies the simulation experiment of hardware circuit fault classification.It summarizes the positive impact of hardware fault classification methods for IC chips on the analysis of hardware defects.