双层样本中界面对太赫兹时域光谱的影响研究

Influence of interface reflection on terahertz spectroscopy of double compression tablets

针对多层样本中界面对太赫兹时域光谱的影响问题,利用太赫兹时域光谱测试了由不同粒径制成的单、双层沙粒压片,获得了单、双层压片样本的太赫兹时域谱。结果表明,双层样本的单位厚度太赫兹峰值衰减系数明显小于单层样本的单位厚度衰减系数。因此,在研究双层样品太赫兹光谱响应时应添加某个系数以消除由样品的界面反射影响,且该系数与材料的特性有关。

In order to study the influence of interface reflection on terahertz(THz)spectroscopy of double compression tablets,the THz time-domain spectroscopy(THz-TDS)was used to detect the single-and two-layer sand tablets made of different particle sizes,and the THz-TDS were obtained.The results show that the THz peak attenuation coefficient of the unit thickness of the double-layer sample was significantly smaller than that of the single-layer sample.Therefore,a coefficient should be added to study THz spectral response of double-layer samples to eliminate the loss caused by interface reflection of samples,and the coefficient was related to the characteristics of materials.