摘要
针对嵌入式技术的仪器仪表存在有通用性能差、功能单一及性能低的缺点,本文提出了对嵌入式技术的通用性仪器仪表平台化硬件系统设计的需求,并且通过ARM结构下的嵌入式技术处理器设计出了主办硬件平台,最后在对该仪器仪表的平台进行了调试测试,并给出结果。
In view of the shortcomings of the embedded instruments, such as poor general performance, single function and low performance, this paper puts forward the requirements for the platform hardware system design of the embedded instruments, and designs the host hardware platform through the embedded technology processor under the arm structure. Finally, the platform of the instrument is debugged and tested. The results are given.
作者
温锦辉
Wen Jinhui(Wuhan Transportation Vocational College,Wuhan Hubei,430065)
出处
《电子测试》
2019年第23期43-44,123,共3页
Electronic Test