基于双结构光的微小圆柱端面缺陷检测

Detection of Tiny Cylindrical End Face Defects Based on Double Structure Light

针对表面结构复杂的微小圆柱形元件设计了一套新的端面缺陷检测系统,使用两套光栅型结构光,采用左右交叉、对称打光的方式,提取条纹和交叉点特征,然后通过高斯混合模型对交叉点特征进行分类,从而对微小圆柱端面是否存在缺陷进行快速、准确地测量.实验结果表明,该系统不仅能实现对微小圆柱端面缺陷部分的准确提取,同时对每个圆柱端面判断的时间不超过0.4 s,完全满足工业自动化检测的要求.

A new end-face defect detection system was designed for the tiny cylindrical components with complex surface structure.Two sets of grating-type structured light were adopted to implement left and right crossover and symmetric lighting.The characteristics of the intersections of light strips and light strips were extracted.Then the intersections were classified by Gaussian mixture model to realize the fast and accurate detection of the presence or absence of defects in the tiny cylindrical end faces.The experimental results showed that the system not only could realize the accurate extraction of the defect area of the tiny cylinder,but also the time for judging the end faces of each tiny cylindrical component was not more than 0.4 s,which fully met the needs of automated inspection in industry.