摘要
介电常数(D--k)一直都是电路基材的重要指标。近年很多基材厂商开始提出设计D_k的概念,其目的在于通过前期的测试手段直接得到后期终端可以直接使用的Dk结果。本文基于点频方案和扫频方案,考察验证了谐振环和差分相位两种设计D_k的实验方案,并比较了这两种设计D_k考察方案的实际效果。
The dielectric constant has always been an important indicator of circuit substrates.In recent years,many substrate manufacturers have begun to propose the concept of design Dk.Based on the point frequency and sweep frequency scheme,this paper examines the design Dk that are tested by resonant ring method and differential phase method and then compares the actual effect of the two design Dk test methods.
作者
朱泳名
葛鹰
Zhu Yongming;Ge Ying
出处
《印制电路信息》
2019年第12期14-17,共4页
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