飞行时间二次离子质谱（TOF-SIMS）在矿物加工中的应用进展

Advances in Application of TOF-SIMS in Mineral Processing

TOF-SIMS作为一种物质表面分析技术,可以用于物质表面的活性参数的测定。在简述TOF-SIMS的工作原理、工作模式以及技术优势的基础上,对飞行时间二次离子质谱(TOF-SIMS)在矿物加工中的应用进行了综述。SIMS技术作为一种质谱技术,具有独特的质谱性质,如百万分之一的灵敏度、同位素的区别、甚至可以对复杂分子进行检测,为所有需要极端表面敏感性和表面分子信息的测定提供了可能。总结了SIMS技术在难免离子对矿物表面性质的影响、表面润湿性以及表面吸附机理方面的应用进展。指出TOF-SIMS技术能够提供可靠的表面化学数据,用于评价磨矿过程中矿物表面发生的各种反应、浮选过程造成各种矿物分离的因素、分析药剂的作用机理。TOF-SIMS技术在未来可以作为选择合适浮选药剂的手段,用来优化浮选过程的选择性和提高回收率,或帮助设计适合特定矿物浮选所需的药剂。

As a kind of material surface analysis technology,TOF-SIMS can determine the active parameters of material surface. Based on a brief description of the working principle,working mode and technical advantages of TOF-SIMS,the application of time of flight secondary ion mass spectrometry(TOF-SIMS)in mineral processing is reviewed. As a mass spectrometry technology,SIMS technology has unique mass spectral properties, such as sensitivity of one per million, isotopic differentiation, and even detection of complex molecules, providing the possibility for determination of all extreme surface sensitivity and surface molecular information. The application progress of SIMS technology in the influence of unavoidable ions on mineral surface properties, surface wettability and surface adsorption mechanism was summarized. It is pointed out that the TOF-SIMS technology can provide reliable surface chemical data, which can be used to evaluate the various reactions on the mineral surface during the grinding process, the factors causing the separation of various minerals during the flotation process, and to analyze the action mechanism of agents. In the future, TOF-SIMS technology can be used as means of selecting suitable agents to optimize the selectivity and increase recovery of flotation, or to help design agents suitable for specific mineral flotation.