摘要
We propose a diamond-based micron-scale sensor and perform high-resolution B-field imaging of the near-field distribution of coplanar waveguides.The sensor consists of diamond crystals attached to the tip of a tapered fiber with a physical size on the order of submicron.The amplitude of the B-field component B is obtained by measuring the Rabi oscillation frequency.The result of Rabi sequence is fitted with a decayed sinusoidal.We apply the modulation-locking technique that demonstrates the vector-resolved field mapping of the micromachine coplanar waveguide structure(CPW).B-field line scan was performed on the CPW with a scan step size of 1.25μm.To demonstrate vector resolved rf field sensing,a full field line scan acts(was performed)along four NV axes at a height of 50μm above the device surface.The simulations are compared with the experimental results by vector-resolved measurement.This technique allows the measurement of weak microwave signals with a minimum resolvable modulation depth of 20 ppm.The sensor will have great interest in micron-scale resolved microwave B-field measurements,such as electromagnetic compatibility testing of microwave integrated circuits and characterization of integrated microwave components.
We propose a diamond-based micron-scale sensor and perform high-resolution B-field imaging of the near-field distribution of coplanar waveguides. The sensor consists of diamond crystals attached to the tip of a tapered fiber with a physical size on the order of submicron. The amplitude of the B-field component B is obtained by measuring the Rabi oscillation frequency. The result of Rabi sequence is fitted with a decayed sinusoidal. We apply the modulation-locking technique that demonstrates the vector-resolved field mapping of the micromachine coplanar waveguide structure(CPW). B-field line scan was performed on the CPW with a scan step size of 1.25 μm. To demonstrate vector resolved rf field sensing, a full field line scan acts(was performed) along four NV axes at a height of 50 μm above the device surface. The simulations are compared with the experimental results by vector-resolved measurement. This technique allows the measurement of weak microwave signals with a minimum resolvable modulation depth of 20 ppm. The sensor will have great interest in micron-scale resolved microwave B-field measurements, such as electromagnetic compatibility testing of microwave integrated circuits and characterization of integrated microwave components.
基金
Support by the Jiangsu Distinguished Professor Program under Grant No RK002STP15001
the NJUPT Principal Distinguished Professor Program under Grant No NY214136
