基于紧凑型光电传感器的复合绝缘子内部缺陷检测方法研究

Research on Detection Method of Internal Defects of Composite Insulator Based on Compact Photoelectric Sensor

为了能够有效地对复合绝缘子的内部缺陷进行监测,通过有限元法和现场试验研究了紧凑型光电电场传感器检测复合绝缘子内部缺陷的方法。首先,依据实际110kV复合绝缘子的实际尺寸和材料属性建立了三维有限元模型,导通性缺陷分别设置在复合绝缘子的高压端、接地端和中间端,研究了不同位置和不同程度的导通性缺陷对周围电场分布影响;然后基于有限元仿真计算研究了复合绝缘子周围轴向电场和径向电场分布的变化。结果表明,当复合绝缘子存在内部导通性缺陷时,径向电场分布的变化相对轴向电场分布的变化要更为明显;不同位置的导通性缺陷导致电场分布变化的特征不同;不同严重程度的导通性缺陷导致电场分布的畸变量会随着导通性缺陷的严重程度的增加而增加;最后,通过试验验证了EOEF传感器检测高压复合绝缘子的内部缺陷的有效性。这对于在非固定端检测获取缺陷信息有着重要的意义。

In order to effectively monitor the internal defects of composite insulators,finite element method and field test were used to detect the internal defects of composite insulators by compact photoelectric electric field sensor.Firstly,a 3 Dfinite element model was established based on the genuine size and material properties of the 110 kV composite insulators.The impacts of different locations and degrees of continuity defects on the surrounding electric field distribution were studied.Continuity defects were placed on the high voltage end,ground end and intermediate end of the composite insulators,respectively.The variation of axial electric field and radial electric field distribution around composite insulators was studied based on finite element simulation.The results show that when the composite insulators have internal continuity defects,the change of the radial electric field distribution is more obvious than that of the axial electric field distribution.Continuity defects at different locations result in different characteristics of electric field distribution changes.Different severity of continuity defects lead to an increase in the distortion of the electric field distribution as the severity of the continuity defect increases.Finally,test verified the effectiveness of detecting internal defects of high voltage composite insulators with EOEF sensors.This phenomenon is of great significance for defecting information at non-fixed end.